Russian Microelectronics
Impact Factor & Key Scientometrics

Russian Microelectronics
Overview

Impact Factor

NA

H Index

19

Impact Factor

0.686

I. Basic Journal Info

Country

United States
Journal ISSN: 10637397, 16083415
Publisher: Pleiades Publishing
History: 1996-2021
Journal Hompage: Link
How to Get Published:
Find out more

Research Categories

Scope/Description:

Russian Microelectronics covers physical technological and some VLSI and ULSI circuittechnical aspects of microelectronics and nanoelectronics it informs the reader of new trends in submicron optical xray electron and ionbeam lithography technology dry processing techniques etching doping and deposition and planarization technology. Significant space is devoted to problems arising in the application of proton electron and ion beams plasma etc. Consideration is given to new equipment including cluster tools and control in situ and submicron CMOS bipolar and BICMOS technologies. The journal publishes papers addressing problems of molecular beam epitaxy and related processes heterojunction devices and integrated circuits the technology and devices of nanoelectronics and the fabrication of nanometer scale devices including new device structures quantumeffect devices and superconducting devices. The reader will find papers containing news of the diagnostics of surfaces and microelectronic structures the modeling of technological processes and devices in micro and nanoelectronics including nanotransistors and solid state qubits.

II. Science Citation Report (SCR)



Russian Microelectronics
SCR Impact Factor

Russian Microelectronics
SCR Journal Ranking

Russian Microelectronics
SCImago SJR Rank

SCImago Journal Rank (SJR indicator) is a measure of scientific influence of scholarly journals that accounts for both the number of citations received by a journal and the importance or prestige of the journals where such citations come from.

Russian Microelectronics
Scopus 2-Year Impact Factor Trend

Note: impact factor data for reference only

Russian Microelectronics
Scopus 3-Year Impact Factor Trend

Note: impact factor data for reference only

Russian Microelectronics
Scopus 4-Year Impact Factor Trend

Note: impact factor data for reference only

Russian Microelectronics
Impact Factor History

2-year 3-year 4-year
  • 2023 Impact Factor
    0.379 0.414 0.422
  • 2022 Impact Factor
    0.541 0.579 0.54
  • 2021 Impact Factor
    0.686 0.601 0.554
  • 2020 Impact Factor
    0.603 0.508 0.448
  • 2019 Impact Factor
    0.494 0.437 0.429
  • 2018 Impact Factor
    0.43 0.451 0.446
  • 2017 Impact Factor
    0.552 0.537 0.537
  • 2016 Impact Factor
    0.568 0.541 0.537
  • 2015 Impact Factor
    0.625 0.686 0.642
  • 2014 Impact Factor
    0.407 NA NA
  • 2013 Impact Factor
    0.195 NA NA
  • 2012 Impact Factor
    0.301 NA NA
  • 2011 Impact Factor
    0.287 NA NA
  • 2010 Impact Factor
    0.207 NA NA
  • 2009 Impact Factor
    0.211 NA NA
  • 2008 Impact Factor
    0.22 NA NA
  • 2007 Impact Factor
    0.175 NA NA
  • 2006 Impact Factor
    0.232 NA NA
  • 2005 Impact Factor
    0.219 NA NA
  • 2004 Impact Factor
    0.206 NA NA
  • 2003 Impact Factor
    0.072 NA NA
  • 2002 Impact Factor
    0.04 NA NA
  • 2001 Impact Factor
    0.252 NA NA
  • 2000 Impact Factor
    0.11 NA NA
Note: impact factor data for reference only

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Impact Factor

Impact factor (IF) is a scientometric factor based on the yearly average number of citations on articles published by a particular journal in the last two years. A journal impact factor is frequently used as a proxy for the relative importance of a journal within its field. Find out more: What is a good impact factor?

III. Other Science Influence Indicators

Any impact factor or scientometric indicator alone will not give you the full picture of a science journal. There are also other factors such as H-Index, Self-Citation Ratio, SJR, SNIP, etc. Researchers may also consider the practical aspect of a journal such as publication fees, acceptance rate, review speed. (Learn More)

Russian Microelectronics
H-Index

The h-index is an author-level metric that attempts to measure both the productivity and citation impact of the publications of a scientist or scholar. The index is based on the set of the scientist's most cited papers and the number of citations that they have received in other publications

19

Russian Microelectronics
H-Index History

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