IEEE International Conference on Microelectronic Test Structures
Impact Factor & Key Scientometrics

IEEE International Conference on Microelectronic Test Structures
Overview

Impact Factor

H Index

23

Impact Factor

39

I. Basic Journal Info

Country

United States
Journal ISSN: -
Publisher: Institute of Electrical and Electronics Engineers Inc.
History: 1988, 1993-2020
Journal Hompage: Link
How to Get Published:
Find out more

Research Categories

Scope/Description:

The International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions.

II. Science Citation Report (SCR)



IEEE International Conference on Microelectronic Test Structures
SCR Impact Factor

IEEE International Conference on Microelectronic Test Structures
SCR Journal Ranking

IEEE International Conference on Microelectronic Test Structures
SCImago SJR Rank

SCImago Journal Rank (SJR indicator) is a measure of scientific influence of scholarly journals that accounts for both the number of citations received by a journal and the importance or prestige of the journals where such citations come from.

IEEE International Conference on Microelectronic Test Structures
Scopus 2-Year Impact Factor Trend

Note: impact factor data for reference only

IEEE International Conference on Microelectronic Test Structures
Scopus 3-Year Impact Factor Trend

Note: impact factor data for reference only

IEEE International Conference on Microelectronic Test Structures
Scopus 4-Year Impact Factor Trend

Note: impact factor data for reference only

IEEE International Conference on Microelectronic Test Structures
Impact Factor History

2-year 3-year 4-year
  • 2023 Impact Factor
    32 12 12
  • 2022 Impact Factor
    25 5 5
  • 2021 Impact Factor
    39 0 0
  • 2020 Impact Factor
    67 8 8
  • 2019 Impact Factor
    49 11 11
  • 2018 Impact Factor
    58 13 13
  • 2017 Impact Factor
    70 5 5
  • 2016 Impact Factor
    81 12 12
  • 2015 Impact Factor
    60 10 10
  • 2014 Impact Factor
    53 NA NA
  • 2013 Impact Factor
    73 NA NA
  • 2012 Impact Factor
    96 NA NA
  • 2011 Impact Factor
    58 NA NA
  • 2010 Impact Factor
    79 NA NA
  • 2009 Impact Factor
    102 NA NA
  • 2008 Impact Factor
    120 NA NA
  • 2007 Impact Factor
    100 NA NA
  • 2006 Impact Factor
    NA NA NA
  • 2005 Impact Factor
    NA NA NA
  • 2004 Impact Factor
    NA NA NA
  • 2003 Impact Factor
    NA NA NA
  • 2002 Impact Factor
    NA NA NA
  • 2001 Impact Factor
    NA NA NA
  • 2000 Impact Factor
    NA NA NA
Note: impact factor data for reference only

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Impact Factor

Impact factor (IF) is a scientometric factor based on the yearly average number of citations on articles published by a particular journal in the last two years. A journal impact factor is frequently used as a proxy for the relative importance of a journal within its field. Find out more: What is a good impact factor?

III. Other Science Influence Indicators

Any impact factor or scientometric indicator alone will not give you the full picture of a science journal. There are also other factors such as H-Index, Self-Citation Ratio, SJR, SNIP, etc. Researchers may also consider the practical aspect of a journal such as publication fees, acceptance rate, review speed. (Learn More)

IEEE International Conference on Microelectronic Test Structures
H-Index

The h-index is an author-level metric that attempts to measure both the productivity and citation impact of the publications of a scientist or scholar. The index is based on the set of the scientist's most cited papers and the number of citations that they have received in other publications

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IEEE International Conference on Microelectronic Test Structures
H-Index History

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