IEEE Electron Device Letters
Impact Factor & Key Scientometrics

IEEE Electron Device Letters
Overview

Impact Factor

4.187

H Index

171

Impact Factor

4.766

I. Basic Journal Info

Country

United States
Journal ISSN: 7413106
Publisher: Institute of Electrical and Electronics Engineers
History: 1980-1982, 1988, 1992-ongoing
Journal Hompage: Link
How to Get Published:

Research Categories

Scope/Description:

This publication publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanotechnology, optoelectronics, photovoltaics, power ICs and micro-sensors. Items are restricted to three pages and publication time is two months from the end of the month in which the manuscript is accepted, providing the author responds immediately to all communications.

II. Science Citation Report (SCR)



IEEE Electron Device Letters
SCR Impact Factor

IEEE Electron Device Letters
SCR Journal Ranking

IEEE Electron Device Letters
SCImago SJR Rank

SCImago Journal Rank (SJR indicator) is a measure of scientific influence of scholarly journals that accounts for both the number of citations received by a journal and the importance or prestige of the journals where such citations come from.

1.337

IEEE Electron Device Letters
Scopus 2-Year Impact Factor Trend

Note: impact factor data for reference only

IEEE Electron Device Letters
Scopus 3-Year Impact Factor Trend

Note: impact factor data for reference only

IEEE Electron Device Letters
Scopus 4-Year Impact Factor Trend

Note: impact factor data for reference only

IEEE Electron Device Letters
Impact Factor History

2-year 3-year 4-year
  • 2023 Impact Factor
    #N/A #N/A #N/A
  • 2022 Impact Factor
    4.982 5.081 5.043
  • 2021 Impact Factor
    4.766 4.881 4.798
  • 2020 Impact Factor
    4.441 4.456 4.426
  • 2019 Impact Factor
    4.626 4.533 4.245
  • 2018 Impact Factor
    4.109 3.855 3.698
  • 2017 Impact Factor
    3.864 3.917 3.734
  • 2016 Impact Factor
    3.489 3.442 3.369
  • 2015 Impact Factor
    3.294 3.323 3.312
  • 2014 Impact Factor
    3.402 NA NA
  • 2013 Impact Factor
    3.711 NA NA
  • 2012 Impact Factor
    3.574 NA NA
  • 2011 Impact Factor
    3.649 NA NA
  • 2010 Impact Factor
    3.544 NA NA
  • 2009 Impact Factor
    3.249 NA NA
  • 2008 Impact Factor
    3.598 NA NA
  • 2007 Impact Factor
    3.628 NA NA
  • 2006 Impact Factor
    4.156 NA NA
  • 2005 Impact Factor
    3.899 NA NA
  • 2004 Impact Factor
    3.649 NA NA
  • 2003 Impact Factor
    3.654 NA NA
  • 2002 Impact Factor
    3.128 NA NA
  • 2001 Impact Factor
    2.651 NA NA
  • 2000 Impact Factor
    2.562 NA NA
Note: impact factor data for reference only

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Impact Factor

Impact factor (IF) is a scientometric factor based on the yearly average number of citations on articles published by a particular journal in the last two years. A journal impact factor is frequently used as a proxy for the relative importance of a journal within its field. Find out more: What is a good impact factor?


III. Other Science Influence Indicators

Any impact factor or scientometric indicator alone will not give you the full picture of a science journal. There are also other factors such as H-Index, Self-Citation Ratio, SJR, SNIP, etc. Researchers may also consider the practical aspect of a journal such as publication fees, acceptance rate, review speed. (Learn More)

IEEE Electron Device Letters
H-Index

The h-index is an author-level metric that attempts to measure both the productivity and citation impact of the publications of a scientist or scholar. The index is based on the set of the scientist's most cited papers and the number of citations that they have received in other publications

171

IEEE Electron Device Letters
H-Index History